Scanning-gate-induced effects and spatial mapping of a cavity

R. Steinacher, A. A. Kozikov, C. Rössler, C. Reichl, W. Wegscheider, T. Ihn, K. Ensslin

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Tailored electrostatic potentials are at the heart of semiconductor nanostructures. We present measurements of size and screening effects of the tip-induced potential in scanning gate microscopy on a two-dimensional electron gas. First, we show methods on how to estimate the size of the tip-induced potential. Second, a ballistic cavity is studied as a function of the bias-voltage of the metallic top gates and probed with the tip-induced potential. It is shown how the potential of the cavity changes by tuning the system to a regime where conductance quantization in the constrictions formed by the tip and the top gates occurs. This conductance quantization leads to a unprecedented rich fringe pattern over the entire structure. Third, the effect of electrostatic screening of the metallic top gates is discussed.

    Original languageEnglish
    Article number043043
    JournalNew Journal of Physics
    Volume17
    DOIs
    Publication statusPublished - 1 Apr 2015

    Keywords

    • ballistic cavity
    • scanning gate microscopy
    • tip-induced potential
    • GaAs
    • Electrostatic potential
    • high-mobility GaAs/AlGaAs

    Research Beacons, Institutes and Platforms

    • National Graphene Institute

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