Scattering-type Near-Field Optical Microscopy Characterization of Topological Insulator Bi2Te3 Nanowires

Daniel Johnson; Thomas Vincent; Xinyun Liu; Abdolbaset Gholizadeh; P Schoenherr; Thorsten Hesjedal; Olga Kazakova; Nathaniel  Huang; Jessica Louise Boland

Scattering-type Near-Field Optical Microscopy Characterization of Topological Insulator Bi2Te3 Nanowires

Daniel Johnson, Thomas Vincent, Xinyun Liu, Abdolbaset Gholizadeh, P Schoenherr, Thorsten Hesjedal, Olga Kazakova, Nathaniel Huang, Jessica Louise Boland

University of Manchester (UOM)

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Journal	International Conference on Infrared, Millimeter, and Terahertz Waves
Publication status	Published - 2023

Cite this

@article{7bb3358b49814902b682a6eb247f43b3,

title = "Scattering-type Near-Field Optical Microscopy Characterization of Topological Insulator Bi2Te3 Nanowires",

author = "Daniel Johnson and Thomas Vincent and Xinyun Liu and Abdolbaset Gholizadeh and P Schoenherr and Thorsten Hesjedal and Olga Kazakova and Nathaniel Huang and Boland, {Jessica Louise}",

year = "2023",

language = "English",

journal = "International Conference on Infrared, Millimeter, and Terahertz Waves",

issn = "2162-2035",

publisher = "IEEE",

}

TY - JOUR

T1 - Scattering-type Near-Field Optical Microscopy Characterization of Topological Insulator Bi2Te3 Nanowires

AU - Johnson, Daniel

AU - Vincent, Thomas

AU - Liu, Xinyun

AU - Gholizadeh, Abdolbaset

AU - Schoenherr, P

AU - Hesjedal, Thorsten

AU - Kazakova, Olga

AU - Huang, Nathaniel

AU - Boland, Jessica Louise

PY - 2023

Y1 - 2023

M3 - Conference article

SN - 2162-2035

JO - International Conference on Infrared, Millimeter, and Terahertz Waves

JF - International Conference on Infrared, Millimeter, and Terahertz Waves

ER -