Abstract
Rectifying contacts have been made by depositing epitaxial films of aluminium and antimony on p-type gallium arsenide by molecular beam epitaxy. The I/V and C/V characteristics were almost ideal. The barrier heights determined from the I/V characteristics were 0.64 eV for aluminium and 0.66 eV for antimony. The significance of these results is briefly discussed.
Original language | English |
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Pages (from-to) | 241-242 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 22 |
Issue number | 5 |
DOIs | |
Publication status | Published - 1 Jan 1986 |
Keywords
- Epitaxy
- Semiconductor devices and materials