Secondary Ion Mass Spectrometry, SIMS XV. (Proceedings of the Fifteenth International Conference held in UK 12-16 September 2005.) [In: Appl. Surf. Sci., 2006; 252(19)]

Alex Henderson; John C. Vickerman; Ian S. Gilmore; Mark G. Dowsett

Secondary Ion Mass Spectrometry, SIMS XV. (Proceedings of the Fifteenth International Conference held in UK 12-16 September 2005.) [In: Appl. Surf. Sci., 2006; 252(19)]

Alex Henderson, John C. Vickerman (Editor), Ian S. Gilmore (Editor), Mark G. Dowsett (Editor)

Research output: Book/Report › Scholarly edition › peer-review

Original language	English
Publisher	Elsevier BV
Publication status	Published - 2006

Keywords

Secondary-ion mass spectrometry (Secondary Ion Mass Spectrometry)
secondary ion mass spectrometry book

Research Beacons, Institutes and Platforms

Manchester Institute of Biotechnology

Cite this

@book{d1ee25e99f1a416e960493684e34cbf9,

title = "Secondary Ion Mass Spectrometry, SIMS XV. (Proceedings of the Fifteenth International Conference held in UK 12-16 September 2005.) [In: Appl. Surf. Sci., 2006; 252(19)]",

keywords = "Secondary-ion mass spectrometry (Secondary Ion Mass Spectrometry), secondary ion mass spectrometry book",

author = "Alex Henderson",

editor = "Vickerman, {John C.} and Gilmore, {Ian S.} and Dowsett, {Mark G.}",

note = "CAN 145:365946 73-8 Optical, Electron, and Mass Spectroscopy and Other Related Properties Neth. Book",

year = "2006",

language = "English",

publisher = "Elsevier BV",

address = "Netherlands",

}

TY - BOOK

T1 - Secondary Ion Mass Spectrometry, SIMS XV. (Proceedings of the Fifteenth International Conference held in UK 12-16 September 2005.) [In: Appl. Surf. Sci., 2006; 252(19)]

AU - Henderson, Alex

A2 - Vickerman, John C.

A2 - Gilmore, Ian S.

A2 - Dowsett, Mark G.

N1 - CAN 145:365946 73-8 Optical, Electron, and Mass Spectroscopy and Other Related Properties Neth. Book

PY - 2006

Y1 - 2006

KW - Secondary-ion mass spectrometry (Secondary Ion Mass Spectrometry)

KW - secondary ion mass spectrometry book

M3 - Scholarly edition

BT - Secondary Ion Mass Spectrometry, SIMS XV. (Proceedings of the Fifteenth International Conference held in UK 12-16 September 2005.) [In: Appl. Surf. Sci., 2006; 252(19)]

PB - Elsevier BV

ER -