Semiconductor Quantum Devices for Optical Tomography (Review)

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 3rd World Congress in Industrial Process Tomography
    Place of PublicationBanff (Canada)
    Pages171-180
    Number of pages10
    Publication statusPublished - 2003
    Event3rd World Congress on Industrial Process Tomography - Banff, Canada
    Duration: 2 Sept 20035 Sept 2003

    Conference

    Conference3rd World Congress on Industrial Process Tomography
    CityBanff, Canada
    Period2/09/035/09/03

    Cite this