Semiconductor Quantum Devices for Optical Tomography (Review)

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proceedings of the 3rd World Congress in Industrial Process Tomography
Place of Publication	Banff (Canada)
Pages	171-180
Number of pages	10
Publication status	Published - 2003
Event	3rd World Congress on Industrial Process Tomography - Banff, Canada Duration: 2 Sept 2003 → 5 Sept 2003

Conference	3rd World Congress on Industrial Process Tomography
City	Banff, Canada
Period	2/09/03 → 5/09/03

Cite this

@inproceedings{d9bf044848fa4345bcbee98d6873bc4b,

title = "Semiconductor Quantum Devices for Optical Tomography (Review)",

author = "K.B. Ozanyan",

year = "2003",

language = "English",

isbn = "0-85316-240-9",

pages = "171--180",

booktitle = "Proceedings of the 3rd World Congress in Industrial Process Tomography",

note = "3rd World Congress on Industrial Process Tomography ; Conference date: 02-09-2003 Through 05-09-2003",

}

TY - GEN

T1 - Semiconductor Quantum Devices for Optical Tomography (Review)

AU - Ozanyan, K.B.

PY - 2003

Y1 - 2003

M3 - Conference contribution

SN - 0-85316-240-9

SP - 171

EP - 180

BT - Proceedings of the 3rd World Congress in Industrial Process Tomography

CY - Banff (Canada)

T2 - 3rd World Congress on Industrial Process Tomography

Y2 - 2 September 2003 through 5 September 2003

ER -