Abstract
A method of detecting the presence of a node (12) within a stem (10) of a plant, the method comprising making two measurements of a component of the electrical impedance of the stem (10), wherein a first measurement is made at a first location along the stem (10) and a second measurement is made at a second location along the stem (10), comparing the first measured component of the electrical impedance and the second measured component of the electrical impedance to produce a resultant output, and analysing the resultant output in order to determine the presence of a node or otherwise at the first location or the second location.
| Original language | English |
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| Patent number | WO2011/018402 |
| Publication status | Published - 17 Feb 2011 |