Sensitivity Analysis in 3D Magnetic Induction Tomography (MIT)

W R Lionheart, M Soleimani, A J Peyton

    Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

    Original languageEnglish
    Title of host publication3rd World Congress on Industrial Process Tomography
    PublisherInternational Society for Industrial Process Tomography
    ISBN (Print)9780853163190
    Publication statusPublished - 2003

    Cite this