Serial block-face scanning electron microscopy for three-dimensional imaging of electrical trees

Roger Schurch; Simon M. Rowland; Tobias Starborg

doi:10.1109/ICSD.2013.6619714

Serial block-face scanning electron microscopy for three-dimensional imaging of electrical trees

Roger Schurch, Simon M. Rowland, Tobias Starborg

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

174 Downloads (Pure)

Abstract

Electrical trees are defects that can grow in polymeric insulation and cause power equipment failure. They have been imaged mainly using two-dimensional approaches. Here we present the use of Serial Block-Face Scanning Electron Microscopy (SBFSEM) for three-dimensional (3-D) model reconstruction of electrical trees. SBFSEM is an automated process of serial sectioning combined with block-face imaging of the sample, inside a chamber of a low-vacuum SEM. Two polymeric samples with a bush and branch-type electrical trees were examined using SBFSEM. 3-D replicas of sections of the tree were created and tree characteristics quantified. Parameters such as diameter and number of tree channels, tree volume and proportion of volume degraded were obtained and compared, indicating that electrical trees can be classified through these parameters. © 2013 IEEE.

Original language	English
Title of host publication	Proceedings of IEEE International Conference on Solid Dielectrics, ICSD\|Proc. IEEE Int. Conf. Solid Dielectrics, ICSD
Pages	271-274
Number of pages	3
DOIs	https://doi.org/10.1109/ICSD.2013.6619714
Publication status	Published - 2013
Event	ICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics - Bologna Duration: 1 Jul 2013 → …

Conference

Conference	ICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics
City	Bologna
Period	1/07/13 → …

Keywords

3-D
electrical tree
imaging
SBFSEM
SEM
three-dimensional

Access to Document

10.1109/ICSD.2013.6619714

FULL-TEXT

Cite this

@inproceedings{b9df1eeecbd242c5b935cefc9f52f429,

title = "Serial block-face scanning electron microscopy for three-dimensional imaging of electrical trees",

abstract = "Electrical trees are defects that can grow in polymeric insulation and cause power equipment failure. They have been imaged mainly using two-dimensional approaches. Here we present the use of Serial Block-Face Scanning Electron Microscopy (SBFSEM) for three-dimensional (3-D) model reconstruction of electrical trees. SBFSEM is an automated process of serial sectioning combined with block-face imaging of the sample, inside a chamber of a low-vacuum SEM. Two polymeric samples with a bush and branch-type electrical trees were examined using SBFSEM. 3-D replicas of sections of the tree were created and tree characteristics quantified. Parameters such as diameter and number of tree channels, tree volume and proportion of volume degraded were obtained and compared, indicating that electrical trees can be classified through these parameters. {\textcopyright} 2013 IEEE.",

keywords = "3-D, electrical tree, imaging, SBFSEM, SEM, three-dimensional",

author = "Roger Schurch and Rowland, {Simon M.} and Tobias Starborg",

year = "2013",

doi = "10.1109/ICSD.2013.6619714",

language = "English",

isbn = "9781479908073",

pages = "271--274",

booktitle = "Proceedings of IEEE International Conference on Solid Dielectrics, ICSD|Proc. IEEE Int. Conf. Solid Dielectrics, ICSD",

note = "ICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics ; Conference date: 01-07-2013",

}

Schurch, R, Rowland, SM & Starborg, T 2013, Serial block-face scanning electron microscopy for three-dimensional imaging of electrical trees. in Proceedings of IEEE International Conference on Solid Dielectrics, ICSD|Proc. IEEE Int. Conf. Solid Dielectrics, ICSD. pp. 271-274, ICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics, Bologna, 1/07/13. https://doi.org/10.1109/ICSD.2013.6619714

Serial block-face scanning electron microscopy for three-dimensional imaging of electrical trees. / Schurch, Roger; Rowland, Simon M.; Starborg, Tobias.
Proceedings of IEEE International Conference on Solid Dielectrics, ICSD|Proc. IEEE Int. Conf. Solid Dielectrics, ICSD. 2013. p. 271-274.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Serial block-face scanning electron microscopy for three-dimensional imaging of electrical trees

AU - Schurch, Roger

AU - Rowland, Simon M.

AU - Starborg, Tobias

PY - 2013

Y1 - 2013

N2 - Electrical trees are defects that can grow in polymeric insulation and cause power equipment failure. They have been imaged mainly using two-dimensional approaches. Here we present the use of Serial Block-Face Scanning Electron Microscopy (SBFSEM) for three-dimensional (3-D) model reconstruction of electrical trees. SBFSEM is an automated process of serial sectioning combined with block-face imaging of the sample, inside a chamber of a low-vacuum SEM. Two polymeric samples with a bush and branch-type electrical trees were examined using SBFSEM. 3-D replicas of sections of the tree were created and tree characteristics quantified. Parameters such as diameter and number of tree channels, tree volume and proportion of volume degraded were obtained and compared, indicating that electrical trees can be classified through these parameters. © 2013 IEEE.

AB - Electrical trees are defects that can grow in polymeric insulation and cause power equipment failure. They have been imaged mainly using two-dimensional approaches. Here we present the use of Serial Block-Face Scanning Electron Microscopy (SBFSEM) for three-dimensional (3-D) model reconstruction of electrical trees. SBFSEM is an automated process of serial sectioning combined with block-face imaging of the sample, inside a chamber of a low-vacuum SEM. Two polymeric samples with a bush and branch-type electrical trees were examined using SBFSEM. 3-D replicas of sections of the tree were created and tree characteristics quantified. Parameters such as diameter and number of tree channels, tree volume and proportion of volume degraded were obtained and compared, indicating that electrical trees can be classified through these parameters. © 2013 IEEE.

KW - 3-D

KW - electrical tree

KW - imaging

KW - SBFSEM

KW - SEM

KW - three-dimensional

U2 - 10.1109/ICSD.2013.6619714

DO - 10.1109/ICSD.2013.6619714

M3 - Conference contribution

SN - 9781479908073

SP - 271

EP - 274

BT - Proceedings of IEEE International Conference on Solid Dielectrics, ICSD|Proc. IEEE Int. Conf. Solid Dielectrics, ICSD

T2 - ICSD 2013 - Proceedings of the 2013 IEEE International Conference on Solid Dielectrics

Y2 - 1 July 2013

ER -

Serial block-face scanning electron microscopy for three-dimensional imaging of electrical trees

Abstract

Conference

Keywords

Access to Document

Fingerprint

Cite this