Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation

Dimitris Agiakatsikas, Nikos Foutris, Aitzan Sari, Vasileios Vlagkoulis, Ioanna Souvatzoglou, Mihalis Psarakis, Ruiqi Ye, John Goodacre, Mikel Luján, Maria Kastriotou, Carlo Cazzaniga, Chris Frost

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Abstract

The AMD UltraScale+ XCZU9EG, a multiprocessor system-on-chip (MPSoC) with integrated programmable logic (PL), is vulnerable to the effects of atmospheric radiation due to its large SRAM count. This article explores the effectiveness of the MPSoC's embedded soft-error mitigation mechanisms through accelerated atmospheric-like neutron radiation testing and dependability analysis. We test the device on a broad range of workloads, such as multithreaded software for pose estimation and weather prediction and a software/hardware codesign image classification application running on the AMD deep-learning processing unit (DPU). We found that for a one-node MPSoC system in New York City at 40 k feet (e.g., avionics), software applications demonstrate a mean time to failure (MTTF) of over 121 months, evidencing effective upset recovery. However, specific workloads, such as the DPU, displayed an MTTF of 4 months, which is attributed to the high failure rate of its PL accelerator. Yet, we show the DPU's MTTF can be extended to 87 months with no extra overhead by ignoring the failure rate of tolerable errors since these do not affect the DPU results.
Original languageEnglish
JournalIEEE Transactions on Reliability
DOIs
Publication statusPublished - 29 Sept 2023

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