Size-dependent reversal of grains in perpendicular magnetic recording media measured by small-angle polarized neutron scattering

S. J. Lister, T. Thomson, J. Kohlbrecher, K. Takano, V. Venkataramana, S. J. Ray, M. P. Wismayer, M. A. De Vries, H. Do, Y. Ikeda, S. L. Lee

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Polarized small-angle neutron scattering has been used to measure the magnetic structure of a CoCrPt-SiOx thin-film data storage layer, contained within a writable perpendicular recording media, at granular (
    Original languageEnglish
    Article number112503
    JournalApplied Physics Letters
    Volume97
    Issue number11
    DOIs
    Publication statusPublished - 13 Sept 2010

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