Abstract
The surface coverage of Sr on doped MgO ceramics has been measured by XPS for bulk doping levels in the range 3 to 30 ppm. The experimental data are compared with results derived from ionic model simulations of the doped surface.
Original language | English |
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Article number | 057 |
Pages (from-to) | SB237-SB238 |
Journal | Journal of Physics: Condensed Matter |
Volume | 1 |
DOIs | |
Publication status | Published - 1989 |