Stoichiometry related phenomena in low temperature grown GaAs

M. Missous*, S. O'Hagan

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

Abstract

The growth of GaAs at low temperatures (LT-GaAs) at or below 250 °C, under standard Molecular Beam Epitaxy (MBE) growth conditions, usually results in a massive incorporation of excess As in the lattice which then totally dominates the electrical and optical characteristics of the as grown material. We report on new phenomena associated with the growth of GaAs at 250 °C and we show, for the first time, data on highly electrically active doped material. By careful control of the growth conditions, namely As4/Ga flux ratios, material in which total defect concentrations of less than 1017 cm-3, well below the huge 1020 cm-3 that is normally obtained in LT-GaAs, can be achieved thereby demonstrating that high quality GaAs can in effect be grown at extremely low temperatures.

Original languageEnglish
Title of host publicationMaterials Research Society Symposium Proceedings
PublisherMaterials Research Society
Pages371-376
Number of pages6
ISBN (Print)1558992243
Publication statusPublished - 1 Jan 1994
EventProceedings of the Symposium on Defects in Advanced Semiconductors: Physics and Applications - Boston, MA, USA
Duration: 29 Nov 19931 Dec 1993

Publication series

NameMaterials Research Society Symposium Proceedings
Volume325
ISSN (Print)0272-9172

Conference

ConferenceProceedings of the Symposium on Defects in Advanced Semiconductors: Physics and Applications
CityBoston, MA, USA
Period29/11/931/12/93

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