Structure and luminescence of rare earth-doped silicon oxides studied through XANES and XEOL

Luminescent Si-based materials are of significant interest due to their potential applications in the fields of photonics and solid state lighting. The use of rare earth dopants incorporated into Si-based materials allows the attainment of specific wavelengths of emission for color tunability. Details of the RE luminescence and even the ability to obtain luminescence are strongly dependent on the composition and structure of the Si-based host material. Through the use of X-ray absorption spectroscopy details of the atomic bonding environment of the films has been obtained. X-ray excited optical luminescence, measured after excitation at the absorption edges of the constituent atoms within these materials, reveals that excitation of the rare earth ions occurs primarily at energies related to oxygen states