Study of erbium-doped silicon nanocrystals in silica

Ursel Bangert, Richard Baker (Editor)

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Journal of Physics Conference Series Volume: 241
Editors	Richard Baker
Publisher	IOP Publishing Ltd
Pages	012097
DOIs	https://doi.org/10.1088/1742-6596/241/1/012097
Publication status	Published - 2010
Event	ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009) - Sheffield Duration: 8 Sept 2009 → 11 Sept 2009

Conference	ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009)
City	Sheffield
Period	8/09/09 → 11/09/09

Keywords

@inproceedings{d1afca711a044cd6b93c8071861dccd8,

title = "Study of erbium-doped silicon nanocrystals in silica",

keywords = "silicon nanocrystal, Erbium, TEM, EELS,",

author = "Ursel Bangert and Richard Baker",

year = "2010",

doi = "10.1088/1742-6596/241/1/012097",

language = "English",

pages = "012097",

editor = "Richard Baker",

booktitle = "Journal of Physics Conference Series Volume: 241",

publisher = "IOP Publishing Ltd",

address = "United Kingdom",

note = "ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009) ; Conference date: 08-09-2009 Through 11-09-2009",

}

TY - GEN

T1 - Study of erbium-doped silicon nanocrystals in silica

AU - Bangert, Ursel

A2 - Baker, Richard

PY - 2010

Y1 - 2010

KW - silicon nanocrystal, Erbium, TEM, EELS,

UR - https://www.scopus.com/pages/publications/85009286364

U2 - 10.1088/1742-6596/241/1/012097

DO - 10.1088/1742-6596/241/1/012097

M3 - Conference contribution

SP - 012097

BT - Journal of Physics Conference Series Volume: 241

PB - IOP Publishing Ltd

T2 - ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009)

Y2 - 8 September 2009 through 11 September 2009

ER -