Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution
- A. Aryshev
- , R. Ainsworth
- , T. Aumeyr
- , M. Bergamaschi
- , S.T. Boogert
- , P. Karataev
- , R. Kieffer
- , K. Kruchinin
- , T. Lefevre
- , S. Mazzoni
- , L. Nevay
- , N. Terunuma
- , J. Urakawa
Research output: Contribution to journal › Article › peer-review