Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution

A. Aryshev, R. Ainsworth, T. Aumeyr, M. Bergamaschi, S.T. Boogert, P. Karataev, R. Kieffer, K. Kruchinin, T. Lefevre, S. Mazzoni, L. Nevay, N. Terunuma, J. Urakawa

Research output: Contribution to journal › Article › peer-review

Fingerprint

Dive into the research topics of 'Sub-micron scale transverse electron beam size diagnostics methodology based on the analysis of optical transition radiation source distribution'. Together they form a unique fingerprint.

Physics

Engineering