Summary of ISO/TC 201 standard: XXII. ISO 22048:2004 - Surface chemical analysis - Information format for static secondary ion mass spectrometry

I. S. Gilmore, M. P. Seah, A. Henderson

    Research output: Contribution to journalArticlepeer-review

    Abstract

    This International Standard provides a digital format to store and transfer between computers, in a compact way, important calibration and instrumental parameter data necessary to make effective use of spectral data files from static SIMS instruments. This format is designed to supplement the data transfer format specified in ISO 14976. © Crown Copyright 2004. Reproduced with the permission of Her Majesty's Stationary Office. Published by John Wiley & Sons Ltd.
    Original languageEnglish
    Pages (from-to)1642-1644
    Number of pages2
    JournalSurface and Interface Analysis
    Volume36
    Issue number13
    DOIs
    Publication statusPublished - 15 Dec 2004

    Keywords

    • Data transfer format
    • Mass scale
    • Secondary ion
    • Secondary ion mass spectrometry
    • SIMS
    • Time of flight
    • ToF

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