Surface Decoration for Improving the Accuracy of Displacement Measurements by Digital Image Correlation in SEM

B Winiarski, GS Schajer, PJ Withers

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)793-804
    Number of pages12
    JournalExperimental Mechanics
    Volume52
    Issue number7
    DOIs
    Publication statusPublished - 2012

    Keywords

    • 2D digital image correlation
    • Focused ion beam
    • High magnifications
    • Residual stress
    • Scanning electron microscopy
    • Speckle pattern
    • Submicron scale

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