Symposium 3: X-ray microanalysis of thin specimens-The application of AEM and APFIM to the analysis of precipitation behavior in alloy 718

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	161-162
Number of pages	2
Journal	Institute of Physics Conference Series
Volume	165
Publication status	Published - 2000

Cite this

@article{0c0788c1b9d9441490200598e99afce3,

title = "Symposium 3: X-ray microanalysis of thin specimens-The application of AEM and APFIM to the analysis of precipitation behavior in alloy 718",

author = "MG Burke and MK Miller",

year = "2000",

language = "English",

volume = "165",

pages = "161--162",

journal = "Institute of Physics Conference Series",

publisher = "IOP Publishing Ltd",

}