Synchrotron X-ray Diffraction

Research output: Chapter in Book/Conference proceeding › Chapter › peer-review

Original language	English
Title of host publication	Practical Residual Stress Measurement Methods
Editors	Gary S. Schajer
Place of Publication	Chichester
Publisher	John Wiley & Sons Ltd
Pages	163-194
Number of pages	32
ISBN (Electronic)	9781118402832
ISBN (Print)	9781118342374
Publication status	Published - 2013

Cite this

@inbook{97b94c3dc46b4fc0a73fab34734cf5ba,

title = "Synchrotron X-ray Diffraction",

author = "Withers, {Philip J}",

note = "Times Cited: 1 Schajer, GS 978-1-118-34237-4",

year = "2013",

language = "English",

isbn = "9781118342374",

pages = "163--194",

editor = "{Schajer }, {Gary S.}",

booktitle = "Practical Residual Stress Measurement Methods",

publisher = "John Wiley & Sons Ltd",

address = "United Kingdom",

}