Abstract
High-temperature piezoelectric (1-x)Bi(Mg1/2Zr1/2)O3-xPbTiO3 (BMZ-xPT) ceramics of the composition very close to their morphotropic phase boundary (MPB) were synthesized by conventional mixed oxide method. The purpose was to prepare high Tc ceramics without using costly Sc2O3. The ceramics were characterized at room temperature by X-ray diffraction (XRD) and dielectric spectroscopic techniques. The MPB of BMZ-xPT ceramics was found to lie around 0.54 x 0.57. The dielectric constant showed a significant low frequency dispersion associated to conduction mechanism. The complex impedance plot showed characteristics of bulk electrical behavior of the ceramics.
Original language | English |
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Pages (from-to) | 72-76 |
Number of pages | 4 |
Journal | Ferroelectrics |
Volume | 346 |
DOIs | |
Publication status | Published - 2007 |
Keywords
- Bi based perovskites
- High temperature piezoelectric ceramics
- Morphotropic phase boundary