Synthesis and dielectric investigations of (1-x) Bi(Mg1/2Zr 1/2)O3-xPbTiO3 high temperature piezoelectric ceramics

G. Shabbir, A. H. Qureshi, S. Kojima, D. A. Hall

    Research output: Contribution to journalArticlepeer-review

    Abstract

    High-temperature piezoelectric (1-x)Bi(Mg1/2Zr1/2)O3-xPbTiO3 (BMZ-xPT) ceramics of the composition very close to their morphotropic phase boundary (MPB) were synthesized by conventional mixed oxide method. The purpose was to prepare high Tc ceramics without using costly Sc2O3. The ceramics were characterized at room temperature by X-ray diffraction (XRD) and dielectric spectroscopic techniques. The MPB of BMZ-xPT ceramics was found to lie around 0.54 x 0.57. The dielectric constant showed a significant low frequency dispersion associated to conduction mechanism. The complex impedance plot showed characteristics of bulk electrical behavior of the ceramics.
    Original languageEnglish
    Pages (from-to)72-76
    Number of pages4
    JournalFerroelectrics
    Volume346
    DOIs
    Publication statusPublished - 2007

    Keywords

    • Bi based perovskites
    • High temperature piezoelectric ceramics
    • Morphotropic phase boundary

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