Tapered coaxial microwave probe sensor

L. A. Valiente; A. A P Gibson; A. D. Haigh

doi:10.1049/el:20046391

Tapered coaxial microwave probe sensor

L. A. Valiente, A. A P Gibson, A. D. Haigh

Research output: Contribution to journal › Article › peer-review

Abstract

A tapered coaxial cavity probe sensor is introduced to demonstrate progressive improvements in the spatial resolution of metallisation patterns for scanning microwave microscopy (SMM) applications. Two versions of this design are described and experimental results illustrate the advantages of a reduced end area surrounding the projecting probe.

Original language	English
Pages (from-to)	1483-1484
Number of pages	1
Journal	Electronics Letters
Volume	40
Issue number	23
DOIs	https://doi.org/10.1049/el:20046391
Publication status	Published - 11 Nov 2004

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title = "Tapered coaxial microwave probe sensor",

abstract = "A tapered coaxial cavity probe sensor is introduced to demonstrate progressive improvements in the spatial resolution of metallisation patterns for scanning microwave microscopy (SMM) applications. Two versions of this design are described and experimental results illustrate the advantages of a reduced end area surrounding the projecting probe.",

author = "Valiente, {L. A.} and Gibson, {A. A P} and Haigh, {A. D.}",

year = "2004",

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doi = "10.1049/el:20046391",

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AU - Valiente, L. A.

AU - Gibson, A. A P

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PY - 2004/11/11

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N2 - A tapered coaxial cavity probe sensor is introduced to demonstrate progressive improvements in the spatial resolution of metallisation patterns for scanning microwave microscopy (SMM) applications. Two versions of this design are described and experimental results illustrate the advantages of a reduced end area surrounding the projecting probe.

AB - A tapered coaxial cavity probe sensor is introduced to demonstrate progressive improvements in the spatial resolution of metallisation patterns for scanning microwave microscopy (SMM) applications. Two versions of this design are described and experimental results illustrate the advantages of a reduced end area surrounding the projecting probe.

U2 - 10.1049/el:20046391

DO - 10.1049/el:20046391

M3 - Article

SN - 0013-5194

VL - 40

SP - 1483

EP - 1484

JO - Electronics Letters

JF - Electronics Letters

IS - 23

ER -

Tapered coaxial microwave probe sensor

Abstract

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