@inbook{947a1b9d12684e9bb076d573af9ce490,
title = "Temperature measurement of low-current discharges based on N-2 (2+) molecular emission spectra: 2012 Annual Report Conference on Electrical Insulation and Dielectric Phenomena",
abstract = "A series of experiments has been carried out to determine the gas temperature of low current (<; 5 mA) discharges in ambient conditions. The measurement is based on optical emission spectroscopy (OES) analysis using N2 (2+) molecular emission spectra of the air discharge. Temperatures of discharges of different current levels with various arc lengths have been measured and analysis has been carried out to determine the relationships between discharge temperatures, discharge currents and arc lengths. Between lengths of 2 and 6 mm, and currents of 3 and 4.5 mA, predictable temperature variations were found between 1200 and 1800 k.",
keywords = "Current measurement, Discharges (electric), Fault diagnosis, Plasma temperature, Resistors, Temperature measurement",
author = "A. Xiao and Rowland, {S. M.} and Whitehead, {J. C.} and X. Tu",
note = "Times Cited: 0 Ceidp IEEE Conference on Electrical Insulaiton and Dielectric Phenomena (CEIDP) Oct 14-17, 2012 Montreal, CANADA Ieee",
year = "2012",
doi = "10.1109/CEIDP.2012.6378753",
language = "English",
isbn = "0084-9162 978-1-4673-1252-3",
series = "Conference on Electrical Insulation and Dielectric Phenomena Annual Report",
publisher = "IEEE",
pages = "191--194",
booktitle = "2012 Annual Report Conference on Electrical Insulation and Dielectric Phenomena",
address = "United States",
}