Temperature measurement of low-current discharges based on N-2 (2+) molecular emission spectra: 2012 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

    Research output: Chapter in Book/Report/Conference proceedingChapter

    Abstract

    A series of experiments has been carried out to determine the gas temperature of low current (<; 5 mA) discharges in ambient conditions. The measurement is based on optical emission spectroscopy (OES) analysis using N2 (2+) molecular emission spectra of the air discharge. Temperatures of discharges of different current levels with various arc lengths have been measured and analysis has been carried out to determine the relationships between discharge temperatures, discharge currents and arc lengths. Between lengths of 2 and 6 mm, and currents of 3 and 4.5 mA, predictable temperature variations were found between 1200 and 1800 k.
    Original languageEnglish
    Title of host publication2012 Annual Report Conference on Electrical Insulation and Dielectric Phenomena
    PublisherIEEE
    Pages191-194
    Number of pages4
    ISBN (Electronic)978-1-4673-1251-6
    ISBN (Print)0084-9162 978-1-4673-1252-3, 978-1-4673-1253-0
    DOIs
    Publication statusPublished - 2012

    Publication series

    NameConference on Electrical Insulation and Dielectric Phenomena Annual Report
    PublisherIEEE

    Keywords

    • Current measurement
    • Discharges (electric)
    • Fault diagnosis
    • Plasma temperature
    • Resistors
    • Temperature measurement

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