Abstract
We have characterized the chemical composition of three interfaces between metals and a sapphire (Al2O3) single crystal using specular neutron reflection. The interfaces are Sn/sapphire, Sn/sapphire containing a thin, ∼20 nm, Ti interlayer and an interface between sapphire and a Ti-containing Ag-Cu eutectic active braze alloy. We have evaluated the neutron reflection results using a multilayer model of the interface. The technique is extremely sensitive to the presence of Ti at the interface being probed because of the negative neutron scattering length of Ti compared with the positive scattering lengths of the other elements present in the systems. The analysis of the data revealed a thin, ∼70 nm, titanium suboxide layer at the sapphire/active braze alloy interface, consistent with observations made using other techniques. Copyright © 1996 Acta Metallurgical Inc.
| Original language | English |
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| Pages (from-to) | 273-279 |
| Number of pages | 6 |
| Journal | Acta Materialia |
| Volume | 45 |
| Issue number | 1 |
| Publication status | Published - Jan 1997 |