The Effect of Included Flaws Upon the A C Breakdown Strength of Polyethylene

Simon Rowland, R W Coppard, J Bowman, R T Rakowski, R T Durham, S M Rowland

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics
Pages	55-60
Number of pages	6
DOIs	https://doi.org/10.1109/ICSD.1989.69161
Publication status	Published - 1989
Event	3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics - Duration: 1 Jan 1824 → …

Conference	3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics
Period	1/01/24 → …

Access to Document

@inproceedings{4d308dcb14174518b93f3a2962e6f848,

title = "The Effect of Included Flaws Upon the A C Breakdown Strength of Polyethylene",

author = "Simon Rowland and Coppard, {R W} and J Bowman and Rakowski, {R T} and Durham, {R T} and Rowland, {S M}",

year = "1989",

doi = "10.1109/ICSD.1989.69161",

language = "English",

pages = "55--60",

booktitle = "3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics",

note = "3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics ; Conference date: 01-01-1824",

}

Rowland, S, Coppard, RW, Bowman, J, Rakowski, RT, Durham, RT & Rowland, SM 1989, The Effect of Included Flaws Upon the A C Breakdown Strength of Polyethylene. in 3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics. pp. 55-60, 3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics, 1/01/24. https://doi.org/10.1109/ICSD.1989.69161

TY - GEN

T1 - The Effect of Included Flaws Upon the A C Breakdown Strength of Polyethylene

AU - Rowland, Simon

AU - Coppard, R W

AU - Bowman, J

AU - Rakowski, R T

AU - Durham, R T

AU - Rowland, S M

PY - 1989

Y1 - 1989

U2 - 10.1109/ICSD.1989.69161

DO - 10.1109/ICSD.1989.69161

M3 - Conference contribution

SP - 55

EP - 60

BT - 3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics

T2 - 3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics

Y2 - 1 January 1824

ER -