The Effect of Included Flaws Upon the A C Breakdown Strength of Polyethylene

Simon Rowland, R W Coppard, J Bowman, R T Rakowski, R T Durham, S M Rowland

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Original languageEnglish
    Title of host publication3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics
    Pages55-60
    Number of pages6
    DOIs
    Publication statusPublished - 1989
    Event3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics -
    Duration: 1 Jan 1824 → …

    Conference

    Conference3rd IEEE International Conference on Conduction and Breakdown in Solid Dielectrics
    Period1/01/24 → …

    Cite this