The effects of Cu dopant on the microstructure and non-ohmic electrical properties of ZnO varistors

Jiwei Fan, Xiaopeng Li, Zhenguo Zhang, Zhiqiang Jiao, Xiangyang Liu, Wenjing Zhang, Poonsuk Poosimma, Robert Freer

    Research output: Contribution to journalArticlepeer-review

    Abstract

    The doping effects of Cu on the microstructure and non-ohmic electrical properties of ZnO varistors were studied. Addition of Cu2O can enhance the ZnO grain growth during sintering. The SEM and EDS results revealed that the added Cu mainly distributed in the grain boundary and spinel phases of ZnO varistors. The Cu2O addition increased the both of grain and grain boundary resistances. However it decreased the non-ohmic electrical characteristics of ZnO varistors, which is a good agreement with similar findings on Ag2O additions, but contrasts to the reports of good non-ohmic electrical property which found on binary Cu doped ZnO varistors. © (2012) Trans Tech Publications, Switzerland.
    Original languageEnglish
    Pages (from-to)160-165
    Number of pages5
    JournalAdvanced Materials Research
    Volume343-344
    DOIs
    Publication statusPublished - 2012

    Keywords

    • Cu doping
    • Microstructure
    • Non-ohmic Electrical Characteristics
    • ZnO varistor

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