The influence of interfaces and channels on electrical tree growth in epoxy resin

S. Bahadoorsingh; R. Giussani; S. M. Rowland

doi:10.1109/CEIDP.2010.5724010

The influence of interfaces and channels on electrical tree growth in epoxy resin

S. Bahadoorsingh, R. Giussani, S. M. Rowland

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Abstract

This experimental study sought to investigate the influence of interfaces and ventilated channels on electrical tree growth in epoxy resin. The electrical trees were developed in point-plane geometry samples and tested within the voltage range of 6-15 kV rms. Vented channels of diameters in the range 0.16-0.30 mm were employed. The distance to the grounded plane from both the epoxy resin interface and the ventilated channels varied between 0.5-1.5 mm. The time to breakdown is increased when the location of the interface and channels is centred near the insulation gap or is closer to the plane surface, but decreases when the interface is closer to the needle. A narrower breakdown path is observed when the interface layer is present. ©2010 IEEE.

Original language	English
Title of host publication	Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP\|Annu. Rep. Conf. Electr. Insul. Dielectr. Phenom. CEIDP
Publisher	IEEE
ISBN (Print)	9781424494705
DOIs	https://doi.org/10.1109/CEIDP.2010.5724010
Publication status	Published - 2010
Event	2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010 - West Lafayette, IN Duration: 1 Jul 2010 → …

Conference

Conference	2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010
City	West Lafayette, IN
Period	1/07/10 → …

Keywords

Dielectrics
Epoxy resins
Insulation
Partial discharges
Electrical tree growth
Epoxy resin interface
Trees (electrical)
Point-plane geometry sample

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10.1109/CEIDP.2010.5724010

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@inproceedings{21377cfae1a64ffb91fbd9f0c9617df0,

title = "The influence of interfaces and channels on electrical tree growth in epoxy resin",

abstract = "This experimental study sought to investigate the influence of interfaces and ventilated channels on electrical tree growth in epoxy resin. The electrical trees were developed in point-plane geometry samples and tested within the voltage range of 6-15 kV rms. Vented channels of diameters in the range 0.16-0.30 mm were employed. The distance to the grounded plane from both the epoxy resin interface and the ventilated channels varied between 0.5-1.5 mm. The time to breakdown is increased when the location of the interface and channels is centred near the insulation gap or is closer to the plane surface, but decreases when the interface is closer to the needle. A narrower breakdown path is observed when the interface layer is present. {\textcopyright}2010 IEEE.",

keywords = "Dielectrics, Epoxy resins, Insulation, Partial discharges, Electrical tree growth, Epoxy resin interface, Trees (electrical), Point-plane geometry sample",

author = "S. Bahadoorsingh and R. Giussani and Rowland, \{S. M.\}",

year = "2010",

doi = "10.1109/CEIDP.2010.5724010",

language = "English",

isbn = "9781424494705",

booktitle = "Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP|Annu. Rep. Conf. Electr. Insul. Dielectr. Phenom. CEIDP",

publisher = "IEEE",

address = "United States",

note = "2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010 ; Conference date: 01-07-2010",

}

Bahadoorsingh, S, Giussani, R & Rowland, SM 2010, The influence of interfaces and channels on electrical tree growth in epoxy resin. in Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP|Annu. Rep. Conf. Electr. Insul. Dielectr. Phenom. CEIDP. IEEE, 2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010, West Lafayette, IN, 1/07/10. https://doi.org/10.1109/CEIDP.2010.5724010

The influence of interfaces and channels on electrical tree growth in epoxy resin. / Bahadoorsingh, S.; Giussani, R.; Rowland, S. M.
Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP|Annu. Rep. Conf. Electr. Insul. Dielectr. Phenom. CEIDP. IEEE, 2010.

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - The influence of interfaces and channels on electrical tree growth in epoxy resin

AU - Bahadoorsingh, S.

AU - Giussani, R.

AU - Rowland, S. M.

PY - 2010

Y1 - 2010

N2 - This experimental study sought to investigate the influence of interfaces and ventilated channels on electrical tree growth in epoxy resin. The electrical trees were developed in point-plane geometry samples and tested within the voltage range of 6-15 kV rms. Vented channels of diameters in the range 0.16-0.30 mm were employed. The distance to the grounded plane from both the epoxy resin interface and the ventilated channels varied between 0.5-1.5 mm. The time to breakdown is increased when the location of the interface and channels is centred near the insulation gap or is closer to the plane surface, but decreases when the interface is closer to the needle. A narrower breakdown path is observed when the interface layer is present. ©2010 IEEE.

AB - This experimental study sought to investigate the influence of interfaces and ventilated channels on electrical tree growth in epoxy resin. The electrical trees were developed in point-plane geometry samples and tested within the voltage range of 6-15 kV rms. Vented channels of diameters in the range 0.16-0.30 mm were employed. The distance to the grounded plane from both the epoxy resin interface and the ventilated channels varied between 0.5-1.5 mm. The time to breakdown is increased when the location of the interface and channels is centred near the insulation gap or is closer to the plane surface, but decreases when the interface is closer to the needle. A narrower breakdown path is observed when the interface layer is present. ©2010 IEEE.

KW - Dielectrics

KW - Epoxy resins

KW - Insulation

KW - Partial discharges

KW - Electrical tree growth

KW - Epoxy resin interface

KW - Trees (electrical)

KW - Point-plane geometry sample

UR - https://www.scopus.com/pages/publications/79952948001

U2 - 10.1109/CEIDP.2010.5724010

DO - 10.1109/CEIDP.2010.5724010

M3 - Conference contribution

SN - 9781424494705

BT - Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP|Annu. Rep. Conf. Electr. Insul. Dielectr. Phenom. CEIDP

PB - IEEE

T2 - 2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2010

Y2 - 1 July 2010

ER -

The influence of interfaces and channels on electrical tree growth in epoxy resin

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Keywords

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