The Puzzle of Exciton Localisation in GaN-Based Structures: TEM, AFM and 3D APFIM Hold the Key

C. J. Humphreys; N. van der Laak; R. A. Oliver; M. J. Kappers; M. J. Galtrey; J. S. Barnard; D. M. Graham; P. Dawson

doi:10.1007/978-1-4020-8615-1_1

The Puzzle of Exciton Localisation in GaN-Based Structures: TEM, AFM and 3D APFIM Hold the Key

C. J. Humphreys, N. van der Laak, R. A. Oliver, M. J. Kappers, M. J. Galtrey, J. S. Barnard, D. M. Graham, P. Dawson

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Proc. 15th Conference on Microscopy of Semiconducting Materials
Place of Publication	Springer Proceedings in Physics
Publisher	Springer Nature
Pages	3-12
Number of pages	10
Volume	120
DOIs	https://doi.org/10.1007/978-1-4020-8615-1_1
Publication status	Published - 2008
Event	Microscopy of Semiconducting Materials 2007 - Cambridge Duration: 1 Jan 1824 → …

Conference

Conference	Microscopy of Semiconducting Materials 2007
City	Cambridge
Period	1/01/24 → …

Access to Document

10.1007/978-1-4020-8615-1_1

Cite this

Humphreys, C. J., Laak, N. V. D., Oliver, R. A., Kappers, M. J., Galtrey, M. J., Barnard, J. S., Graham, D. M., & Dawson, P. (2008). The Puzzle of Exciton Localisation in GaN-Based Structures: TEM, AFM and 3D APFIM Hold the Key. In Proc. 15th Conference on Microscopy of Semiconducting Materials (Vol. 120, pp. 3-12). Springer Nature. https://doi.org/10.1007/978-1-4020-8615-1_1

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title = "The Puzzle of Exciton Localisation in GaN-Based Structures: TEM, AFM and 3D APFIM Hold the Key",

author = "Humphreys, {C. J.} and Laak, {N. van der} and Oliver, {R. A.} and Kappers, {M. J.} and Galtrey, {M. J.} and Barnard, {J. S.} and Graham, {D. M.} and P. Dawson",

year = "2008",

doi = "10.1007/978-1-4020-8615-1_1",

language = "English",

volume = "120",

pages = "3--12",

booktitle = "Proc. 15th Conference on Microscopy of Semiconducting Materials",

publisher = "Springer Nature",

address = "United States",

note = "Microscopy of Semiconducting Materials 2007 ; Conference date: 01-01-1824",

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Humphreys, CJ, Laak, NVD, Oliver, RA, Kappers, MJ, Galtrey, MJ, Barnard, JS, Graham, DM & Dawson, P 2008, The Puzzle of Exciton Localisation in GaN-Based Structures: TEM, AFM and 3D APFIM Hold the Key. in Proc. 15th Conference on Microscopy of Semiconducting Materials. vol. 120, Springer Nature, Springer Proceedings in Physics, pp. 3-12, Microscopy of Semiconducting Materials 2007, Cambridge, 1/01/24. https://doi.org/10.1007/978-1-4020-8615-1_1

The Puzzle of Exciton Localisation in GaN-Based Structures: TEM, AFM and 3D APFIM Hold the Key. / Humphreys, C. J.; Laak, N. van der; Oliver, R. A. et al.
Proc. 15th Conference on Microscopy of Semiconducting Materials. Vol. 120 Springer Proceedings in Physics: Springer Nature, 2008. p. 3-12.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Oliver, R. A.

AU - Kappers, M. J.

AU - Galtrey, M. J.

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AU - Graham, D. M.

AU - Dawson, P.

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