The rapidly changing face of electron microscopy

John Meurig Thomas; Rowan K. Leary; Alexander S. Eggeman; Paul A. Midgley

doi:10.1016/j.cplett.2015.04.048

The rapidly changing face of electron microscopy

John Meurig Thomas^*, Rowan K. Leary, Alexander S. Eggeman, Paul A. Midgley

^*Corresponding author for this work

University of Cambridge

Research output: Contribution to journal › Article › peer-review

Abstract

This short but wide-ranging review is intended to convey to chemical physicists and others engaged in the interfaces between solid-state chemistry and solid-state physics the growing power and extensive applicability of multiple facets of the technique of electron microscopy.

Original language	English
Pages (from-to)	103-113
Number of pages	11
Journal	Chemical Physics Letters
Volume	631-632
DOIs	https://doi.org/10.1016/j.cplett.2015.04.048
Publication status	Published - 26 May 2015

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title = "The rapidly changing face of electron microscopy",

abstract = "This short but wide-ranging review is intended to convey to chemical physicists and others engaged in the interfaces between solid-state chemistry and solid-state physics the growing power and extensive applicability of multiple facets of the technique of electron microscopy.",

author = "Thomas, {John Meurig} and Leary, {Rowan K.} and Eggeman, {Alexander S.} and Midgley, {Paul A.}",

year = "2015",

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doi = "10.1016/j.cplett.2015.04.048",

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AU - Thomas, John Meurig

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N2 - This short but wide-ranging review is intended to convey to chemical physicists and others engaged in the interfaces between solid-state chemistry and solid-state physics the growing power and extensive applicability of multiple facets of the technique of electron microscopy.

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VL - 631-632

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JO - Chemical Physics Letters

JF - Chemical Physics Letters

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The rapidly changing face of electron microscopy

Abstract

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