The rapidly changing face of electron microscopy

John Meurig Thomas, Rowan K. Leary, Alexander S. Eggeman, Paul A. Midgley

    Research output: Contribution to journalArticlepeer-review


    This short but wide-ranging review is intended to convey to chemical physicists and others engaged in the interfaces between solid-state chemistry and solid-state physics the growing power and extensive applicability of multiple facets of the technique of electron microscopy.

    Original languageEnglish
    Pages (from-to)103-113
    Number of pages11
    JournalChemical Physics Letters
    Publication statusPublished - 26 May 2015


    Dive into the research topics of 'The rapidly changing face of electron microscopy'. Together they form a unique fingerprint.

    Cite this