Abstract
It has previously been reported that preoxidation of the bottom electrode prior to deposition of the Al2 O3 or MgO barrier in magnetic tunnel junctions acts to suppress orange-peel coupling between Co electrodes. Here, we present specular and diffuse X-ray scattering measurements from Co/MgO multilayer repeat structures which suggest that this drop arises from a reduction in the in-plane correlation length of the roughness at the electrode-barrier interface rather than reduction in roughness amplitude. © 2008 IEEE.
Original language | English |
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Pages (from-to) | 3594-3596 |
Number of pages | 2 |
Journal | Ieee Transactions on Magnetics |
Volume | 44 |
Issue number | 11 |
Publication status | Published - Nov 2008 |
Keywords
- Grazing incidence X-ray scattering
- Multilayers
- Orange-peel coupling
- Preoxidation