The Statistics of Breakdown in Thin Aluminium Oxide Films

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	4th IEE Conference on Dielectric Materials, Measurements and Applications
Publisher	IEE
Pages	88-91
Number of pages	4
Publication status	Published - 1984
Event	4th IEE Conference on Dielectric Materials, Measurements and Applications - Duration: 1 Jan 1824 → …

Conference	4th IEE Conference on Dielectric Materials, Measurements and Applications
Period	1/01/24 → …

Cite this

@inproceedings{8897dc014bbe4e949159bcc62220d176,

title = "The Statistics of Breakdown in Thin Aluminium Oxide Films",

author = "Rowland, {S M}",

year = "1984",

language = "English",

pages = "88--91",

booktitle = "4th IEE Conference on Dielectric Materials, Measurements and Applications",

publisher = "IEE",

address = "United Kingdom",

note = "4th IEE Conference on Dielectric Materials, Measurements and Applications ; Conference date: 01-01-1824",

}