The Statistics of Breakdown in Thin Aluminium Oxide Films

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Original languageEnglish
    Title of host publication4th IEE Conference on Dielectric Materials, Measurements and Applications
    PublisherIEE
    Pages88-91
    Number of pages4
    Publication statusPublished - 1984
    Event4th IEE Conference on Dielectric Materials, Measurements and Applications -
    Duration: 1 Jan 1824 → …

    Conference

    Conference4th IEE Conference on Dielectric Materials, Measurements and Applications
    Period1/01/24 → …

    Cite this