Fingerprint
Dive into the research topics of 'Theoretical investigation of the vertical dielectric screening dependence on defects for few-layered van der Waals materials'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Theoretical investigation of the vertical dielectric screening dependence on defects for few-layered van der Waals materials
Amit Singh, Seunghan Lee, Hyeonhu Bae, Jahyun Koo, Li Yang, Hoonkyung Lee
Research output: Contribution to journal › Article › peer-review