Abstract
The influence of heat treatment on the microstructure and the microtexture of electrodeposited Ni and Ni-Co layers was investigated with Electron Backscatter Diffraction (EBSD) with high resolution. Samples were annealed for 1 hour at 523 K and 673 K, the temperature region wherein recrystallisation occurs. The results are discussed in relation to the resolution of EBSD for the very fine grained electrodeposits and previous X-ray diffraction investigations.
| Original language | English |
|---|---|
| Pages (from-to) | 1345-1352 |
| Number of pages | 8 |
| Journal | Materials Science Forum |
| Volume | 467-470 |
| Issue number | II |
| Publication status | Published - 1 Dec 2004 |
| Event | Proceedings of the Second Joint International Conferences on Recrystallization and Grain Growth, ReX and GG2, SF2M - Annecy, France Duration: 30 Aug 2004 → 3 Sept 2004 |
Keywords
- Cobalt
- EBSD
- Electrodeposition
- Microstructure
- Nickel