Thickness measurement device and methods of use

Imad H. Elhajj (Inventor), Daniel Asmar (Inventor), Mahdi Saleh (Inventor), Ghassan Oueidat (Inventor)

Research output: Patent

Abstract

Provided herein are systems, methods and apparatuses for a thickness measurement device based on a capacitive array.

@misc{e2c5612e919e4ff38e3fd8df62824ab6,

title = "Thickness measurement device and methods of use",

abstract = "Provided herein are systems, methods and apparatuses for a thickness measurement device based on a capacitive array.",

author = "Elhajj, {Imad H.} and Daniel Asmar and Mahdi Saleh and Ghassan Oueidat",

year = "2021",

language = "English",

publisher = "Google Patents",

address = "United States",

type = "Patent",

note = "US10976147B2",

}

TY - PAT

T1 - Thickness measurement device and methods of use

AU - Elhajj, Imad H.

AU - Asmar, Daniel

AU - Saleh, Mahdi

AU - Oueidat, Ghassan

PY - 2021

Y1 - 2021

N2 - Provided herein are systems, methods and apparatuses for a thickness measurement device based on a capacitive array.

AB - Provided herein are systems, methods and apparatuses for a thickness measurement device based on a capacitive array.

M3 - Patent

M1 - US10976147B2

PB - Google Patents

ER -