Thickness measurement device and methods of use

Imad H. Elhajj (Inventor), Daniel Asmar (Inventor), Mahdi Saleh (Inventor), Ghassan Oueidat (Inventor)

Research output: Patent


Provided herein are systems, methods and apparatuses for a thickness measurement device based on a capacitive array.
Original languageEnglish
Patent numberUS10976147B2
Publication statusPublished - 2021


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