Three dimensional imaging of electrical trees in micro and nano-filled epoxy resin

R. Schurch; S. M. Rowland; R. S. Bradley; T. Hashimoto; G. E. Thompson; Philip Withers

doi:10.1109/CEIDP.2014.6995882

Three dimensional imaging of electrical trees in micro and nano-filled epoxy resin

R. Schurch, S. M. Rowland, R. S. Bradley, T. Hashimoto, G. E. Thompson, Philip Withers

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Abstract

The authors have previously shown that electrical trees in unfilled polymers can be three-dimensionally (3D) imaged using X-ray computed tomography (XCT) or serial block-face scanning electron microscopy (SBFSEM). Here, we present the results of 3D imaging and analysis of electrical trees in filled epoxy systems for the first time. Electrical trees created in unfilled, micro silica-filled and nano silica-filled epoxy resin were scanned using XCT at the Diamond Light Source synchrotron and then also imaged using SBFSEM. 3D virtual replicas of the trees have been generated and their structures characterised. Imaging in micro-filled epoxy is more challenging than in nano-filled epoxy. It was found that trees in samples filled up to 20 wt% with micro silica can be imaged using either XCT or SBFSEM. In the case considered, the mean diameter of tree channels in micro-filled epoxy was found to be considerably smaller (0.6 µm) than in unfilled or nano-filled epoxies (3 µm).

Original language	English
Title of host publication	host publication
Publisher	IEEE
DOIs	https://doi.org/10.1109/CEIDP.2014.6995882
Publication status	Published - 2014
Event	Conference on Electrical Insulation and Solid Dielectrics (CEIDP) - Des Moines Duration: 1 Jan 1824 → …

Conference

Conference	Conference on Electrical Insulation and Solid Dielectrics (CEIDP)
City	Des Moines
Period	1/01/24 → …

Keywords

X-ray computed tomography, XCT, serial block-face scanning electron microscopy, SBFSEM, Diamond Light Source, electrical tree, micro-filled, nano-filled

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title = "Three dimensional imaging of electrical trees in micro and nano-filled epoxy resin",

abstract = "The authors have previously shown that electrical trees in unfilled polymers can be three-dimensionally (3D) imaged using X-ray computed tomography (XCT) or serial block-face scanning electron microscopy (SBFSEM). Here, we present the results of 3D imaging and analysis of electrical trees in filled epoxy systems for the first time. Electrical trees created in unfilled, micro silica-filled and nano silica-filled epoxy resin were scanned using XCT at the Diamond Light Source synchrotron and then also imaged using SBFSEM. 3D virtual replicas of the trees have been generated and their structures characterised. Imaging in micro-filled epoxy is more challenging than in nano-filled epoxy. It was found that trees in samples filled up to 20 wt% with micro silica can be imaged using either XCT or SBFSEM. In the case considered, the mean diameter of tree channels in micro-filled epoxy was found to be considerably smaller (0.6 µm) than in unfilled or nano-filled epoxies (3 µm).",

keywords = "X-ray computed tomography, XCT, serial block-face scanning electron microscopy, SBFSEM, Diamond Light Source, electrical tree, micro-filled, nano-filled",

author = "R. Schurch and Rowland, {S. M.} and Bradley, {R. S.} and T. Hashimoto and Thompson, {G. E.} and Philip Withers",

note = "Roger Schurch would like to acknowledge the scholarship support of CONICYT (Chilean Research Council in Science and Technology). Philip Withers would like to acknowledge funding from EPSRC for the Manchester X-ray Imaging Facility under EP/F007906/1 and EP/F028431/1.; Conference on Electrical Insulation and Solid Dielectrics (CEIDP) ; Conference date: 01-01-1824",

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doi = "10.1109/CEIDP.2014.6995882",

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AU - Schurch, R.

AU - Rowland, S. M.

AU - Bradley, R. S.

AU - Hashimoto, T.

AU - Thompson, G. E.

AU - Withers, Philip

N1 - Roger Schurch would like to acknowledge the scholarship support of CONICYT (Chilean Research Council in Science and Technology). Philip Withers would like to acknowledge funding from EPSRC for the Manchester X-ray Imaging Facility under EP/F007906/1 and EP/F028431/1.

PY - 2014

Y1 - 2014

N2 - The authors have previously shown that electrical trees in unfilled polymers can be three-dimensionally (3D) imaged using X-ray computed tomography (XCT) or serial block-face scanning electron microscopy (SBFSEM). Here, we present the results of 3D imaging and analysis of electrical trees in filled epoxy systems for the first time. Electrical trees created in unfilled, micro silica-filled and nano silica-filled epoxy resin were scanned using XCT at the Diamond Light Source synchrotron and then also imaged using SBFSEM. 3D virtual replicas of the trees have been generated and their structures characterised. Imaging in micro-filled epoxy is more challenging than in nano-filled epoxy. It was found that trees in samples filled up to 20 wt% with micro silica can be imaged using either XCT or SBFSEM. In the case considered, the mean diameter of tree channels in micro-filled epoxy was found to be considerably smaller (0.6 µm) than in unfilled or nano-filled epoxies (3 µm).

AB - The authors have previously shown that electrical trees in unfilled polymers can be three-dimensionally (3D) imaged using X-ray computed tomography (XCT) or serial block-face scanning electron microscopy (SBFSEM). Here, we present the results of 3D imaging and analysis of electrical trees in filled epoxy systems for the first time. Electrical trees created in unfilled, micro silica-filled and nano silica-filled epoxy resin were scanned using XCT at the Diamond Light Source synchrotron and then also imaged using SBFSEM. 3D virtual replicas of the trees have been generated and their structures characterised. Imaging in micro-filled epoxy is more challenging than in nano-filled epoxy. It was found that trees in samples filled up to 20 wt% with micro silica can be imaged using either XCT or SBFSEM. In the case considered, the mean diameter of tree channels in micro-filled epoxy was found to be considerably smaller (0.6 µm) than in unfilled or nano-filled epoxies (3 µm).

KW - X-ray computed tomography, XCT, serial block-face scanning electron microscopy, SBFSEM, Diamond Light Source, electrical tree, micro-filled, nano-filled

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DO - 10.1109/CEIDP.2014.6995882

M3 - Conference contribution

BT - host publication

PB - IEEE

T2 - Conference on Electrical Insulation and Solid Dielectrics (CEIDP)

Y2 - 1 January 1824

ER -

Three dimensional imaging of electrical trees in micro and nano-filled epoxy resin

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