Abstract
Electrical trees are degraded paths in polymeric insulation and are the mechanism of electrical failure of high voltage insulation systems. Previous studies have confirmed the application of X-ray Computed Tomography (XCT) imaging of electrical trees using phase contrast enhancement. This work evaluates the feasibility of X-ray imaging of electrical trees to measure growth at several stages of growth in the same treeing sample. The impact of x-ray dose on the epoxy resin studied is determined experimentally. An example of multi-stage tree imaging using laboratory micro-XCT and reconstructed renderings is provided. Based on the three-dimensional tree models, characteristics such as the degraded volume and surface area can be quantified. Furthermore, a comparison between two stages is presented to show the growth of the electrical tree in a fixed period of time. Insight into the treeing characteristics is also discussed.
| Original language | English |
|---|---|
| Title of host publication | IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) |
| Publication status | E-pub ahead of print - 15 Jan 2018 |
Keywords
- Electrical trees
- 3D
- X-ray
- tensile tests
- FTIR
- multiple stages