ToF-SIMS studies of Bacillus using multivariate analysis with possible identification and taxonomic applications

C. E. Thompson, J. Ellis, J. S. Fletcher, R. Goodacre, A. Henderson, N. P. Lockyer, J. C. Vickerman

    Research output: Contribution to journalArticlepeer-review

    Abstract

    In this paper we discuss the application of ToF-SIMS with an Au3+ primary ion beam, combined with principal components analysis (PCA) and discriminant function analysis (DFA) for the identification of individual strains of two Bacillus species. The ToF-SIMS PC-DFA methodology is capable of distinguishing bacteria at the strain level based on analysis of surface chemical species. By classifying the data using hierarchical cluster analysis (HCA) we are able to show quantitative separation of species and of these strains. This has taxonomic implications in the areas of rapid identification of pathogenic microbes isolated from the clinic, food and environment. © 2006.
    Original languageEnglish
    Pages (from-to)6719-6722
    Number of pages3
    JournalApplied Surface Science
    Volume252
    Issue number19
    DOIs
    Publication statusPublished - 30 Jul 2006

    Keywords

    • Bacillus
    • DFA
    • Multivariate analysis
    • PCA
    • Taxonomy
    • ToF-SIMS

    Research Beacons, Institutes and Platforms

    • Manchester Institute of Biotechnology

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