Towards a 'universal curve' for total electron-yield XAS

Sven L M Schroeder

    Research output: Contribution to journalArticlepeer-review


    Depth distribution functions of KLL Auger electrons emitted from 40 solid elements (10 <Z <57) have been calculated by Monte-Carlo simulations of electron trajectories. A simple analytical expression reproduces all results quite accurately in terms of the total electron range, which is a material-and energy-dependent parameter. It is shown that this formula allows quick estimates of the depth information contained in total electron-yield (TEY) X-ray absorption spectra at photon energies in the keV range.
    Original languageEnglish
    Pages (from-to)405-409
    Number of pages4
    JournalSolid State Communications
    Issue number5
    Publication statusPublished - May 1996


    • A. surfaces and interfaces
    • A. thin films
    • C. EXAFS
    • E. synchrotron radiation
    • E. X-ray and γ-ray spectroscopies
    • NEXAFS
    • SEXAFS


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