Towards a 'universal curve' for total electron-yield XAS

Sven L M Schroeder

doi:10.1016/0038-1098(96)00035-X

Towards a 'universal curve' for total electron-yield XAS

Sven L M Schroeder

Research output: Contribution to journal › Article › peer-review

Abstract

Depth distribution functions of KLL Auger electrons emitted from 40 solid elements (10 <Z <57) have been calculated by Monte-Carlo simulations of electron trajectories. A simple analytical expression reproduces all results quite accurately in terms of the total electron range, which is a material-and energy-dependent parameter. It is shown that this formula allows quick estimates of the depth information contained in total electron-yield (TEY) X-ray absorption spectra at photon energies in the keV range.

Original language	English
Pages (from-to)	405-409
Number of pages	4
Journal	Solid State Communications
Volume	98
Issue number	5
DOIs	https://doi.org/10.1016/0038-1098(96)00035-X
Publication status	Published - May 1996

Keywords

A. surfaces and interfaces
A. thin films
C. EXAFS
E. synchrotron radiation
E. X-ray and γ-ray spectroscopies
NEXAFS
SEXAFS

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10.1016/0038-1098(96)00035-X

Cite this

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title = "Towards a 'universal curve' for total electron-yield XAS",

abstract = "Depth distribution functions of KLL Auger electrons emitted from 40 solid elements (10 <Z <57) have been calculated by Monte-Carlo simulations of electron trajectories. A simple analytical expression reproduces all results quite accurately in terms of the total electron range, which is a material-and energy-dependent parameter. It is shown that this formula allows quick estimates of the depth information contained in total electron-yield (TEY) X-ray absorption spectra at photon energies in the keV range.",

keywords = "A. surfaces and interfaces, A. thin films, C. EXAFS, E. synchrotron radiation, E. X-ray and γ-ray spectroscopies, NEXAFS, SEXAFS",

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year = "1996",

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AU - Schroeder, Sven L M

PY - 1996/5

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N2 - Depth distribution functions of KLL Auger electrons emitted from 40 solid elements (10 <Z <57) have been calculated by Monte-Carlo simulations of electron trajectories. A simple analytical expression reproduces all results quite accurately in terms of the total electron range, which is a material-and energy-dependent parameter. It is shown that this formula allows quick estimates of the depth information contained in total electron-yield (TEY) X-ray absorption spectra at photon energies in the keV range.

AB - Depth distribution functions of KLL Auger electrons emitted from 40 solid elements (10 <Z <57) have been calculated by Monte-Carlo simulations of electron trajectories. A simple analytical expression reproduces all results quite accurately in terms of the total electron range, which is a material-and energy-dependent parameter. It is shown that this formula allows quick estimates of the depth information contained in total electron-yield (TEY) X-ray absorption spectra at photon energies in the keV range.

KW - A. surfaces and interfaces

KW - A. thin films

KW - C. EXAFS

KW - E. synchrotron radiation

KW - E. X-ray and γ-ray spectroscopies

KW - NEXAFS

KW - SEXAFS

U2 - 10.1016/0038-1098(96)00035-X

DO - 10.1016/0038-1098(96)00035-X

M3 - Article

SN - 0038-1098

VL - 98

SP - 405

EP - 409

JO - Solid State Communications

JF - Solid State Communications

IS - 5

ER -

Towards a 'universal curve' for total electron-yield XAS

Abstract

Keywords

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