Abstract
Field effect devices (FED) manufactured from monolayer graphene are investigated. A conventional CMOS-compatible top-down process flow is applied, except for graphene deposition. From IV-characteristics carrier mobilities in graphene pseudo-MOS structures are extracted and compared to state-of-the-art silicon MOSFETs. The extracted values outperform the universal mobility of silicon and silicon-on-insulaior MOSFETs. ©The Electrochemical Society.
| Original language | English |
|---|---|
| Pages (from-to) | 413-419 |
| Number of pages | 6 |
| Journal | ECS Transactions |
| Volume | 11 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2007 |