Trace analyses of Pt and Au using primary ion beams of Cs+ and K+: A comparative study

G McMahon; LJ Cabri; A Hamed; RL Hervig; P Williams

Trace analyses of Pt and Au using primary ion beams of Cs+ and K+: A comparative study

G McMahon, LJ Cabri, A Hamed, RL Hervig, P Williams

The Manchester Museum

Research output: Chapter in Book/Conference proceeding › Chapter › peer-review

Original language	Undefined
Title of host publication	Secondary ion mass spectrometry
Subtitle of host publication	SIMS XII : proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5-10, 1999
Editors	A Benninghoven
Place of Publication	Amsterdam
Publisher	Elsevier BV
Pages	131-134
Number of pages	4
Volume	12
ISBN (Print)	0444503234
Publication status	Published - 2000

Cite this

McMahon, G., Cabri, LJ., Hamed, A., Hervig, RL., & Williams, P. (2000). Trace analyses of Pt and Au using primary ion beams of Cs+ and K+: A comparative study. In A. Benninghoven (Ed.), Secondary ion mass spectrometry : SIMS XII : proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5-10, 1999 (Vol. 12, pp. 131-134). Elsevier BV.

McMahon, G ; Cabri, LJ ; Hamed, A et al. / Trace analyses of Pt and Au using primary ion beams of Cs+ and K+: A comparative study. Secondary ion mass spectrometry : SIMS XII : proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5-10, 1999. editor / A Benninghoven. Vol. 12 Amsterdam : Elsevier BV, 2000. pp. 131-134

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author = "G McMahon and LJ Cabri and A Hamed and RL Hervig and P Williams",

year = "2000",

language = "Undefined",

isbn = "0444503234 ",

volume = "12",

pages = "131--134",

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booktitle = "Secondary ion mass spectrometry",

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McMahon, G, Cabri, LJ, Hamed, A, Hervig, RL & Williams, P 2000, Trace analyses of Pt and Au using primary ion beams of Cs+ and K+: A comparative study. in A Benninghoven (ed.), Secondary ion mass spectrometry : SIMS XII : proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5-10, 1999. vol. 12, Elsevier BV, Amsterdam, pp. 131-134.

Trace analyses of Pt and Au using primary ion beams of Cs+ and K+: A comparative study. / McMahon, G; Cabri, LJ; Hamed, A et al.
Secondary ion mass spectrometry : SIMS XII : proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5-10, 1999. ed. / A Benninghoven. Vol. 12 Amsterdam: Elsevier BV, 2000. p. 131-134.

Research output: Chapter in Book/Conference proceeding › Chapter › peer-review

McMahon G, Cabri LJ, Hamed A, Hervig RL, Williams P. Trace analyses of Pt and Au using primary ion beams of Cs+ and K+: A comparative study. In Benninghoven A, editor, Secondary ion mass spectrometry : SIMS XII : proceedings of the Twelfth International Conference on Secondary Ion Mass Spectrometry (SIMS XII), Université Catholique de Louvain, Brussels, Belgium, September 5-10, 1999. Vol. 12. Amsterdam: Elsevier BV. 2000. p. 131-134