Transmission electron microscopy without aberrations: Applications to materials science

Angus Kirkland, Lan Yun Chang, Sarah Haigh, Crispin Hetherington

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approaches and a combination of the two provides additional advantages. This paper describes aberration corrected instrumentation installed in Oxford which is equipped with correctors for both the image-forming and probe-forming lenses. Examples of the use of these instruments in the characterisation of nanocrystalline catalysts are given together with initial results combining direct and indirect methods. © 2007 Elsevier B.V. All rights reserved.
    Original languageEnglish
    Pages (from-to)425-428
    Number of pages3
    JournalCurrent Applied Physics
    Volume8
    Issue number3-4
    DOIs
    Publication statusPublished - May 2008

    Keywords

    • Aberration correction
    • Exit wave reconstruction
    • Nanocrystalline catalysis

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