Abstract
Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approaches and a combination of the two provides additional advantages. This paper describes aberration corrected instrumentation installed in Oxford which is equipped with correctors for both the image-forming and probe-forming lenses. Examples of the use of these instruments in the characterisation of nanocrystalline catalysts are given together with initial results combining direct and indirect methods. © 2007 Elsevier B.V. All rights reserved.
Original language | English |
---|---|
Pages (from-to) | 425-428 |
Number of pages | 3 |
Journal | Current Applied Physics |
Volume | 8 |
Issue number | 3-4 |
DOIs | |
Publication status | Published - May 2008 |
Keywords
- Aberration correction
- Exit wave reconstruction
- Nanocrystalline catalysis