Transmission-function correction for XPS spectrum imaging

John Walton; Neal Fairley

doi:10.1002/sia.2131

Transmission-function correction for XPS spectrum imaging

John Walton, Neal Fairley

Research output: Chapter in Book/Conference proceeding › Conference contribution › peer-review

Abstract

A procedure is described to characterise the performance of an imaging X-ray photoelectron spectroscopy (XPS) instrument and to determine the intensity/energy response function at each pixel in an image, to provide traceable quantification and chemical-state information from spectrum image data sets. Copyright © 2006 John Wiley & Sons, Ltd.

Original language	English
Title of host publication	Surface and Interface Analysis\|Surf Interface Anal
Place of Publication	Chichester, UK
Publisher	John Wiley & Sons Ltd
Pages	388-391
Number of pages	3
Volume	38
DOIs	https://doi.org/10.1002/sia.2131
Publication status	Published - Apr 2006
Event	European Conference on Applications of Surface and Interface Analysis - Vienna Duration: 25 Sept 2005 → 30 Sept 2005

Conference

Conference	European Conference on Applications of Surface and Interface Analysis
City	Vienna
Period	25/09/05 → 30/09/05

Keywords

Quantification
Spectromicroscopy
Spectrum imaging
Transmission function
XPS

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10.1002/sia.2131

Cite this

@inproceedings{3cfe5e5031024c3ba8e3fa9ed21117b2,

title = "Transmission-function correction for XPS spectrum imaging",

abstract = "A procedure is described to characterise the performance of an imaging X-ray photoelectron spectroscopy (XPS) instrument and to determine the intensity/energy response function at each pixel in an image, to provide traceable quantification and chemical-state information from spectrum image data sets. Copyright {\textcopyright} 2006 John Wiley & Sons, Ltd.",

keywords = "Quantification, Spectromicroscopy, Spectrum imaging, Transmission function, XPS",

author = "John Walton and Neal Fairley",

year = "2006",

month = apr,

doi = "10.1002/sia.2131",

language = "English",

volume = "38",

pages = "388--391",

booktitle = "Surface and Interface Analysis|Surf Interface Anal",

publisher = "John Wiley & Sons Ltd",

address = "United Kingdom",

note = "European Conference on Applications of Surface and Interface Analysis ; Conference date: 25-09-2005 Through 30-09-2005",

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TY - GEN

T1 - Transmission-function correction for XPS spectrum imaging

AU - Walton, John

AU - Fairley, Neal

PY - 2006/4

Y1 - 2006/4

N2 - A procedure is described to characterise the performance of an imaging X-ray photoelectron spectroscopy (XPS) instrument and to determine the intensity/energy response function at each pixel in an image, to provide traceable quantification and chemical-state information from spectrum image data sets. Copyright © 2006 John Wiley & Sons, Ltd.

AB - A procedure is described to characterise the performance of an imaging X-ray photoelectron spectroscopy (XPS) instrument and to determine the intensity/energy response function at each pixel in an image, to provide traceable quantification and chemical-state information from spectrum image data sets. Copyright © 2006 John Wiley & Sons, Ltd.

KW - Quantification

KW - Spectromicroscopy

KW - Spectrum imaging

KW - Transmission function

KW - XPS

U2 - 10.1002/sia.2131

DO - 10.1002/sia.2131

M3 - Conference contribution

VL - 38

SP - 388

EP - 391

BT - Surface and Interface Analysis|Surf Interface Anal

PB - John Wiley & Sons Ltd

CY - Chichester, UK

T2 - European Conference on Applications of Surface and Interface Analysis

Y2 - 25 September 2005 through 30 September 2005

ER -

Transmission-function correction for XPS spectrum imaging

Abstract

Conference

Keywords

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Cite this