Truncated Transient Stability Index for On-line Power System Transient Stability Assessment

Xinlin Ye, Juan Morales Alvarado, Jovica V. Milanovic

Research output: Chapter in Book/Conference proceedingConference contributionpeer-review

183 Downloads (Pure)

Abstract

This paper assesses the ability of a Transient Stability Index (TSI) to evaluate power systems’ transient stability. The assessment is first accomplished by looking into the TSI’s classification accuracy for identifying stable or unstable cases when different transient stability thresholds are used. Although suitable values for these thresholds have been found, there are still some pitfalls in the use of TSI for stability classification. A new approach for the TSI calculation, called Truncated TSI, is proposed, reducing the index’s time window calculation limits. High accuracy of stability classification has been demonstrated using the proposed approach with appropriate settings of the time window parameters.
Original languageEnglish
Title of host publicationProceedings of 2021 IEEE PES Innovative Smart Grid Technologies Europe: Smart Grids: Toward a Carbon-Free Future, ISGT Europe 2021
Number of pages5
ISBN (Electronic)9781665448758
DOIs
Publication statusPublished - 21 Oct 2021
Event2021 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe) - Espoo, Finland
Duration: 18 Oct 202121 Oct 2021

Publication series

NameProceedings of 2021 IEEE PES Innovative Smart Grid Technologies Europe: Smart Grids: Toward a Carbon-Free Future, ISGT Europe 2021

Conference

Conference2021 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe)
Country/TerritoryFinland
CityEspoo
Period18/10/2121/10/21

Keywords

  • contingency screening
  • electrical power system
  • machine learning
  • transient stability assessment
  • transient stability index

Fingerprint

Dive into the research topics of 'Truncated Transient Stability Index for On-line Power System Transient Stability Assessment'. Together they form a unique fingerprint.

Cite this