Understanding Ag liquid migration in SiC through ex-situ and in-situ Ag-Pd/SiC interaction studies

Kerui Wei, Huatang Cao, Han Liu, Daniel Shepherd, Zhiquan Kho, Zixian Su, Jack Donoghue, João P Martins, Matthew Lindley, Xuzhao Liu, Xiangli Zhong, Alexander Eggeman, Sarah j. Haigh, Philip j. Withers, Ping Xiao

Research output: Contribution to journalArticlepeer-review

Abstract

The effective containment of fission products (FPs) within tri-structural isotropic (TRISO) fuel particles is crucial for the safety and efficiency of High Temperature Gas-cooled Reactors (HTGRs). Combining multi-scale (µm to nm) and multi-dimensional (2D and 3D) analysis, this study focuses on the migration mechanisms of silver (Ag), for which the Ag-110 m FP isotope is radiotoxic, facilitated by reactions with palladium (Pd) alloys and the silicon carbide (SiC) layer at elevated temperatures (1300–1500 °C). Three primary pathways for Ag migration are identified: (1) diffusion in solid palladium silicide to form (Pd,Ag)2Si, (2) infiltration through cracks and pores in the carbon phase, and (3) liquid phase migration along SiC grain boundaries. Especially at temperatures above the melting point of Pd2Si (1404 °C), a ‘dissolution-recrystallisation’ mechanism is proposed of the Ag-Pd-Si liquid phase migrating along SiC grain boundaries. The study employs state-of-the-art in-situ heating transmission electron microscopy (TEM) techniques to directly observe the dynamic migration processes of Pd silicide within SiC, providing unprecedented insights into the liquid behaviour in TRISO fuel. These findings highlight the significant role of liquid phases in determining the transport of FPs through the TRISO-SiC which is vital for developing strategies that enhance the safety and efficacy of HTGRs.
Original languageEnglish
Number of pages14
JournalMaterials & Design
Volume245
Early online date2 Sept 2024
DOIs
Publication statusE-pub ahead of print - 2 Sept 2024

Keywords

  • Silicon carbide
  • Cladding material
  • In-situ transmission electron microscopy (TEM)
  • 3D characterization
  • Solid/liquid interface

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