Understanding the In-Situ Reaction of Cerium Oxide Nanoparticles Using Aberration Corrected Exit Wave Restoration and EELS

S Haigh, N Young, H Sawada, K Takayanagi, A Kirkland

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)1592-1593
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume17
    Issue numberS2
    Publication statusPublished - 2011

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