Understanding the Temperature Profile of the IEC TS 62332-1 Dual-temperature Ageing Cell

Berihu Mebrahtom, Shanika Yasantha Matharage, Qiang Liu, Christoph Krause, Attila Gyore, Luke Van Der Zel

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper discusses the challenges faced during the development of a dual-temperature test cell based on IEC technical specification TS 62332-1 to evaluate the ageing performance of transformer insulation systems. A dual-temperature test cell was built based on IEC TS 62332-1 and the performance of the test cell was investigated accordingly. Apart from measuring the conductor and the top liquid temperatures, additional temperature measurements were conducted in other locations including hot solid insulation, cold solid insulation, liquid immersion heaters and test cell surface. Temperature distribution inside the dual-temperature test cell is then analyzed. The results indicate the importance of location of top liquid temperature thermocouples and its effect on the overall temperature distribution. Some additional aspects for maintaining consistency between different test cells are also discussed.

Original languageEnglish
Title of host publication96th IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2021 - co-located with 16th IEEE Nanotechnology Materials and Devices Conference, NMDC 2021
PublisherIEEE
Pages93-96
Number of pages4
ISBN (Electronic)9781665419079
DOIs
Publication statusPublished - 2021
Event96th IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2021 - Vancouver, Canada
Duration: 12 Dec 202115 Dec 2021

Publication series

NameAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Volume2021-December
ISSN (Print)0084-9162

Conference

Conference96th IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2021
Country/TerritoryCanada
CityVancouver
Period12/12/2115/12/21

Fingerprint

Dive into the research topics of 'Understanding the Temperature Profile of the IEC TS 62332-1 Dual-temperature Ageing Cell'. Together they form a unique fingerprint.

Cite this