Abstract
ARM has continuously developed test silicon for its IP to confirm its operation and characteristic. However today's challenges are so much greater, with ARM's latest testchip "Elba" consisting of over 250M transistors there are so many different aspects that need to be understood. In this summary, we'll look at Elba along with some of the design goals and special structures and techniques employed to be able to continue to characterize and understand the operation of today's more complex IP.
Original language | English |
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Title of host publication | host publication |
Publisher | MPSoc |
Publication status | Published - 2011 |
Event | 11th International Forum on Embedded MPSoC and Multicore - Beaune, France Duration: 4 Jul 2011 → 8 Jul 2011 http://www.mpsoc-forum.org/previous/2011/slides/4.1-Goodacre.pdf |
Conference
Conference | 11th International Forum on Embedded MPSoC and Multicore |
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City | Beaune, France |
Period | 4/07/11 → 8/07/11 |
Internet address |