Variable-field magnetic force microscopy

M. Jaafar, J. Gomez-Herrero, A. Gil, P. Ares, M. Vazquez, A. Asenjo

    Research output: Contribution to journalArticlepeer-review


    A new variable external field magnetic force microscope is introduced here. The most outstanding feature of the system is its capability to perform stable images under a variable external magnetic field that can be applied both in in-plane and out-of-plane directions. The performances of the microscope are illustrated for four different suitable selected samples: highly oriented pyrolytic graphite, longitudinal magnetic storage media, FePt thin films with in-plane anisotropy and Ni nanowires with axial easy axis embedded on a ceramic matrix. The use of this variable-field magnetic force microscope as a magnetic writing–reading technique is also shown in this contribution
    Original languageEnglish
    Pages (from-to)693-699
    Number of pages7
    Issue number6
    Publication statusPublished - May 2009


    • Magnetic force microscope
    • Reversal magnetization process
    • Magnetic domains
    • Scanning probe microscopy
    • Magnetic writing-reading process


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