Abstract
A new variable external field magnetic force microscope is introduced here. The most outstanding feature of the system is its capability to perform stable images under a variable external magnetic field that can be applied both in in-plane and out-of-plane directions. The performances of the microscope are illustrated for four different suitable selected samples: highly oriented pyrolytic graphite, longitudinal magnetic storage media, FePt thin films with in-plane anisotropy and Ni nanowires with axial easy axis embedded on a ceramic matrix. The use of this variable-field magnetic force microscope as a magnetic writing–reading technique is also shown in this contribution
Original language | English |
---|---|
Pages (from-to) | 693-699 |
Number of pages | 7 |
Journal | Ultramicroscopy |
Volume | 109 |
Issue number | 6 |
DOIs | |
Publication status | Published - May 2009 |
Keywords
- Magnetic force microscope
- Reversal magnetization process
- Magnetic domains
- Scanning probe microscopy
- Magnetic writing-reading process