WHAT DETERMINES THE PROBING DEPTH OF ELECTRON YIELD XAS

Sven Schroeder, GD MOGGRIDGE, RM ORMEROD, T RAYMENT, RM LAMBERT

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    JournalSurface Science
    Volume324
    Publication statusPublished - 1 Jan 1995

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