WHAT DETERMINES THE PROBING DEPTH OF ELECTRON YIELD XAS (VOL 324, PG L371, 1995)

Sven Schroeder, SLM SCHROEDER, GD MOGGRIDGE, RM ORMEROD, T RAYMENT, RM LAMBERT

Research output: Contribution to journal › Article › peer-review

Cite this

@article{8f1b143455d948e492d2d8ad9b07ddbd,

title = "WHAT DETERMINES THE PROBING DEPTH OF ELECTRON YIELD XAS (VOL 324, PG L371, 1995)",

author = "Sven Schroeder and SLM SCHROEDER and GD MOGGRIDGE and RM ORMEROD and T RAYMENT and RM LAMBERT",

year = "1995",

month = jan,

day = "1",

language = "English",

volume = "329",

journal = "Surface Science",

publisher = "Elsevier BV",

}